Overview
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
Full Product Details
Author: David C. Joy (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
Publisher: Oxford University Press Inc
Imprint: Oxford University Press Inc
Edition: annotated edition
Volume: 9
Dimensions:
Width: 23.40cm
, Height: 1.40cm
, Length: 15.60cm
Weight: 0.499kg
ISBN: 9780195088748
ISBN 10: 0195088743
Pages: 224
Publication Date: 15 June 1995
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: To order
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.
Reviews
<br> For what it aspires to accomplish, this book succeeds and can be recommended on that basis. --Journal of the American Chemical Society<br> Provides an outstanding introduction for the Microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge. . .clearly written and strongly supported by practical examples throughout. --Radiation Physics and Chemistry<br>
For what it aspires to accomplish, this book succeeds and can be recommended on that basis. --Journal of the American Chemical Society<br> Provides an outstanding introduction for the Microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge. . .clearly written and strongly supported by practical examples throughout. --Radiation Physics and Chemistry<br>
<br> For what it aspires to accomplish, this book succeeds and can be recommended on that basis. --Journal of the American Chemical Society<p><br> Provides an outstanding introduction for the Microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge. . .clearly written and strongly supported by practical examples throughout. --RadiationPhysics and Chemistry<p><br>
