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OverviewFull Product DetailsAuthor: Michael TingPublisher: ISTE Ltd and John Wiley & Sons Inc Imprint: ISTE Ltd and John Wiley & Sons Inc Dimensions: Width: 16.10cm , Height: 1.50cm , Length: 23.90cm Weight: 0.308kg ISBN: 9781848214743ISBN 10: 184821474 Pages: 96 Publication Date: 28 January 2014 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsIntroduction ix Chapter 1. Nano MRI 1 Chapter 2. Sparse Image Reconstruction 7 Chapter 3. Iterative Thresholding Methods 15 Chapter 4. Hyperparameter Selection Using the SURE Criterion 43 Chapter 5. Monte Carlo Approach: Gibbs Sampling 53 Chapter 6. Simulation Study 65 Bibliography 73 Index 77ReviewsAuthor InformationMichael Ting is currently a software engineer at Criteo in Paris, France, having received a PhD in Electrical Engineering: Systems, from the University of Michigan, USA, in 2006. His doctoral work focused on signal processing for MRFM. He is a Senior Member of the IEEE and is a co-author of a US patent. His research interests include detection and estimation theory, inverse problems, system identification, and time series analysis. Tab Content 6Author Website:Countries AvailableAll regions |