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OverviewAdvances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Full Product DetailsAuthor: Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Volume: v. 108 Dimensions: Width: 15.20cm , Height: 2.10cm , Length: 22.90cm Weight: 0.610kg ISBN: 9780120147502ISBN 10: 0120147505 Pages: 318 Publication Date: 22 September 1999 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: Out of print, replaced by POD ![]() We will order this item for you from a manufatured on demand supplier. Table of ContentsDynamics. Differential Algebraic Techniques. Fields. Maps: Calculation. Maps: Properties. Spectrometers. Repetitive Systems.ReviewsPRAISE FOR THE SERIES Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf. -MRS BULLETIN With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest. -J.A. Chapman in LABORATORY PRACTICE Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Praise for the Series Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf. --MRS BULLETIN With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest. --J.A. Chapman in LABORATORY PRACTICE Author InformationPeter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Tab Content 6Author Website:Countries AvailableAll regions |