Modeling Nanoscale Imaging in Electron Microscopy
Publisher:   Springer New York
ISBN:  

9781280792250


Pages:   190
Publication Date:   01 January 2012
Format:   Electronic book text
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $340.56 Quantity:  
Add to Cart

Share |

Modeling Nanoscale Imaging in Electron Microscopy


Add your own review!

Overview

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Full Product Details

Publisher:   Springer New York
Imprint:   Springer New York
ISBN:  

9781280792250


ISBN 10:   1280792256
Pages:   190
Publication Date:   01 January 2012
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now