Microscopy of Semiconducting Materials 2001
Author:   A.G. Cullis ,  J L Hutchison
Publisher:   Taylor & Francis Ltd
ISBN:  

9781315895529


Pages:   626
Publication Date:   29 November 2017
Format:   Hardback
Availability:   In Print   Availability explained
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Microscopy of Semiconducting Materials 2001


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Author:   A.G. Cullis ,  J L Hutchison
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   1.320kg
ISBN:  

9781315895529


ISBN 10:   1315895528
Pages:   626
Publication Date:   29 November 2017
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1. High Resolution Microscopy and Microanalysis 2. Self-Organised and Quantum Domain Structures 3. Epitaxy Growth Phenomena 4. Epitaxy Wide Band-Gap Nitrides 5. Processed Silicon, Substrates and Dielectrics 6. Metallization, Silicides and Contacts 7. Device Studies and Specimen Preparation 8. Scanning Probe Microscopy 9. Advanced Scanning Electron and Optical Microscopy.

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Cullis, A.G.

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