Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
Author:   A.G Cullis (University of Sheffield, UK) ,  R Beanland (GEC-Marconi, Towcester, UK)
Publisher:   Taylor & Francis Ltd
Volume:   No. 164
ISBN:  

9780750306508


Pages:   772
Publication Date:   01 January 2000
Format:   Hardback
Availability:   In Print   Availability explained
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Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK


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Overview

This collection of papers provide an international forum for research professionals to discuss and disseminate their results. It focuses on the developments in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. Advances in the use of other microcharactisation techniques including scanning probe microscopy and X-ray topography and diffraction are also featured. The materials of interest cover the complete range of elemental and compound semiconductors.

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Author:   A.G Cullis (University of Sheffield, UK) ,  R Beanland (GEC-Marconi, Towcester, UK)
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   No. 164
Dimensions:   Width: 15.60cm , Height: 4.10cm , Length: 23.40cm
Weight:   1.428kg
ISBN:  

9780750306508


ISBN 10:   0750306505
Pages:   772
Publication Date:   01 January 2000
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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A.G Cullis, R Beanland

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