Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Author:   A.G. Cullis ,  S M Davidson ,  G R Booker
Publisher:   Oxford University Press
ISBN:  

9780854981588


Pages:   300
Publication Date:   01 January 1983
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983


Overview

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Full Product Details

Author:   A.G. Cullis ,  S M Davidson ,  G R Booker
Publisher:   Oxford University Press
Imprint:   IOP Publishing Ltd
Dimensions:   Width: 15.60cm , Height: 3.00cm , Length: 23.40cm
Weight:   1.088kg
ISBN:  

9780854981588


ISBN 10:   0854981586
Pages:   300
Publication Date:   01 January 1983
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Section 1 Structure and properties of dislocations, Section 2 High resolution microscopy, Section 3 Transient annealing phenomena, Section 4 Silicon characterisation, Section 5 Compund semiconductor characterization, Section 6 Scanning EBIC and CL, Section 7 X-ray techniques, Section 8 Non-conventional microscopy, Section 9 Device assement by scanning microscopy, Section 10 Device assessment by transmisison microscopy.

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Author Information

A. G. Cullis (Author) , S. M. Davidson (Edited by) , G. R. Booker (Edited by)

Tab Content 6

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