Overview

The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi­ mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi­ croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro­ analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad­ uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid­ state sciences.

Full Product Details

Author:   B.G. Yacobi ,  L.L. Kazmerski ,  D.B. Holt
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1994 ed.
Dimensions:   Width: 15.50cm , Height: 3.20cm , Length: 23.50cm
Weight:   1.870kg
ISBN:  

9780306444333

ISBN 10:   030644433
Pages:   460
Publication Date:   28 February 1994
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

I. Introduction.- 1. An Introduction to Microanalysis of Solids.- II. Electron Beam Techniques.- 2. Scanning Electron Microscopy.- 3. Transmission Electron Microscopy.- 4. Auger Electron Spectroscopy.- III. Ion Beam Techniques.- 5. Secondary Ion Mass Spectrometry.- 6. Applications of Megaelectron-Volt Ion Beams in Materials Analysis.- IV. Photon Beam Techniques.- 7. Confocal Microscopy.- 8. X-ray Microscopy.- 9. X-ray Photoemission Spectroscopy.- 10. Laser Ionization Mass Spectrometry.- 11. Microellipsometry.- V. Acoustic Wave Excitation.- 12. Scanning Acoustic Microscopy.- VI. Tunneling of Electrons and Scanning Probe Microscopies.- 13. Field Emission, Field Ion Microscopy, and the Atom Probe.- 14. Scanning Probe Microscopy.

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