Micro- and Nanoelectronics: Emerging Device Challenges and Solutions

Author:   Tomasz Brozek (PDF Solutions, San Jose, California, USA) ,  Krzysztof Iniewski (Emerging Technologies CMOS Inc., British Columbia, Canada)
Publisher:   Taylor & Francis Inc
Volume:   35
ISBN:  

9781482214901


Pages:   392
Publication Date:   29 October 2014
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $399.00 Quantity:  
Add to Cart

Share |

Micro- and Nanoelectronics: Emerging Device Challenges and Solutions


Add your own review!

Overview

Micro- and Nanoelectronics: Emerging Device Challenges and Solutions presents a comprehensive overview of the current state of the art of micro- and nanoelectronics, covering the field from fundamental science and material properties to novel ways of making nanodevices. Containing contributions from experts in both industry and academia, this cutting-edge text: Discusses emerging silicon devices for CMOS technologies, fully depleted device architectures, characteristics, and scaling Explains the specifics of silicon compound devices (SiGe, SiC) and their unique properties Explores various options for post-CMOS nanoelectronics, such as spintronic devices and nanoionic switches Describes the latest developments in carbon nanotubes, iii-v devices structures, and more Micro- and Nanoelectronics: Emerging Device Challenges and Solutions provides an excellent representation of a complex engineering field, examining emerging materials and device architecture alternatives with the potential to shape the future of nanotechnology.

Full Product Details

Author:   Tomasz Brozek (PDF Solutions, San Jose, California, USA) ,  Krzysztof Iniewski (Emerging Technologies CMOS Inc., British Columbia, Canada)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Volume:   35
Dimensions:   Width: 15.60cm , Height: 2.80cm , Length: 23.40cm
Weight:   0.703kg
ISBN:  

9781482214901


ISBN 10:   1482214903
Pages:   392
Publication Date:   29 October 2014
Audience:   General/trade ,  College/higher education ,  Professional and scholarly ,  General ,  Tertiary & Higher Education
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

SiGe BiCMOS Technology and Devices. Si–Ge Interdiffusion, Dopant Diffusion, and Segregation in SiGe- and SiGe:C-Based Devices. SiC MOS Devices: N Passivation of Near-Interface Defects. Fully Depleted Devices: FDSOI and FinFET. Fully Depleted SOI Technology Overview. FinFETs: Designing for New Logic Technology. Reliability Issues in Planar and Nonplanar (FinFET) Device Architectures. High-Mobility Channels. 2-D InAs XOI FETs: Fabrication and Device Physics. Beyond-CMOS Devices. Stateful STT-MRAM-Based Logic for Beyond–Von Neumann Computing. Four-State Hybrid Spintronics–Straintronics for Ultralow Power Computing. Nanoionic Switches as Post-CMOS Devices for Neuromorphic Electronics. Physics-Based Compact Graphene Device Modeling. Carbon Nanotube Vertical Interconnects: Prospects and Challenges. Graphene Nanosheet as Ultrathin Barrier.

Reviews

... looks at the challenges of today 's microelectronics and discusses potential paths into the nano-electronic world. It focuses on solutions developed in response to scaling problems with current silicon technologies, and new approaches, and is a combination of papers from world-leading organizations and articles specifically written for it. ... Section III, Post-CMOS Device Concepts, addresses options for future directions in micro- and nano-electronics. An introductory chapter provides a good review of the possible paths for microelectronic device development. ... Richly illustrated with graphs, figures, images, and data, this book is intended for researchers working on emerging scaling topics, engineers developing advanced semiconductor technologies, and graduate students wanting to learn about the barriers and future opportunities in the micro- and nano-electronics industry. -John J. Shea, from IEEE Electrical Insulation Magazine, September/October 2015 - Vol. 31, No. 5 The topic selection is very good, it covers a wide range of advanced technologies, which are either already introduced or currently in the intense development phases. Contributors are well-known in their fields and in a position to provide state-of-the-art overview of the corresponding topics. -Gennadi Bersuker, Sematech, USA This is a timely, well planned, book that covers all the relevant challenges that the industrial and academic electron device research communities have recently overcome, and are nowadays facing to ensure the successful continuation of CMOS technology downscaling and electronic systems evolution toward ultra-high density and ultra-low power. -Luca Selmi, DIEGM, University of Udine, Italy


... looks at the challenges of today 's microelectronics and discusses potential paths into the nano-electronic world. It focuses on solutions developed in response to scaling problems with current silicon technologies, and new approaches, and is a combination of papers from world-leading organizations and articles specifically written for it. ... Section III, Post-CMOS Device Concepts, addresses options for future directions in micro- and nano-electronics. An introductory chapter provides a good review of the possible paths for microelectronic device development. ... Richly illustrated with graphs, figures, images, and data, this book is intended for researchers working on emerging scaling topics, engineers developing advanced semiconductor technologies, and graduate students wanting to learn about the barriers and future opportunities in the micro- and nano-electronics industry. -John J. Shea, from IEEE Electrical Insulation Magazine, September/October 2015 - Vol. 31, No. 5 The topic selection is very good, it covers a wide range of advanced technologies, which are either already introduced or currently in the intense development phases. Contributors are well-known in their fields and in a position to provide state-of-the-art overview of the corresponding topics. -Gennadi Bersuker, Sematech, USA This is a timely, well planned, book that covers all the relevant challenges that the industrial and academic electron device research communities have recently overcome, and are nowadays facing to ensure the successful continuation of CMOS technology downscaling and electronic systems evolution toward ultra-high density and ultra-low power. -Luca Selmi, DIEGM, University of Udine, Italy


a long awaited work by Stephen A. Devaux As a leading specialist in the project management field, Mr. Devaux has developed and demonstrated his novel methodologies using metrics such as Drag, Drag cost, DIPP and Dred. His approach may look somehow unconventional when compared to the ordinary ways relying on PMBOK Guide(r) framework. However, his view that the project is an investment endeavor has led him to deploy the new metrics and technologies described here in this new book. Tomoichi Sato, JGC Corporation/Tokyo University sets a foundation for the value of project delivery reliability and its effect on the program/portfolio business case. In a greater sense, it enlightens organizations regarding the value and importance of improving their organizational project management maturity. takes a value driven approach to organizational project management and is an enabler for Lean thinking with regards to program or portfolio management. Joseph A. Sopko, Joseph A. Sopko Consulting, LLC identifies and illuminates the secret sauce that has been at the root of many successful projects across multiple industries. [the book] can be a key competitive advantage for teams executing in the accelerating world of product development. Edward R Equi, Massachusetts Institute of Technology In his book Stephen Devaux promotes innovative approaches to project management when the project management goal is not just meeting triple constraint but maximizing project business value. He suggested new project metrics that is very useful for informed management decisions and being properly used may save a fortune to project owners. Vladimir Liberzon, Spider Project this book is very useful to practitioners seeking to expand their understanding on managing projects and project portfolios. The new concepts may help even the experienced project managers. The layout of the author s rationales in driving towards the implications containeda


... a long awaited work by Stephen A. Devaux ... As a leading specialist in the project management field, Mr. Devaux has developed and demonstrated his novel methodologies using metrics such as Drag, Drag cost, DIPP and Dred. His approach may look somehow unconventional when compared to the ordinary ways relying on PMBOK Guide(R) framework. However, his view that the project is an investment endeavor has led him to deploy the new metrics and technologies described here in this new book. -Tomoichi Sato, JGC Corporation/Tokyo University ... sets a foundation for the value of project delivery reliability and its effect on the program/portfolio business case. In a greater sense, it enlightens organizations regarding the value and importance of improving their organizational project management maturity. ... takes a value driven approach to organizational project management and is an enabler for Lean thinking with regards to program or portfolio management. -Joseph A. Sopko, Joseph A. Sopko Consulting, LLC ... identifies and illuminates the secret sauce that has been at the root of many successful projects across multiple industries. ... [the book] can be a key competitive advantage for teams executing in the accelerating world of product development. -Edward R Equi, Massachusetts Institute of Technology In his book Stephen Devaux promotes innovative approaches to project management when the project management goal is not just meeting triple constraint but maximizing project business value. He suggested new project metrics that is very useful for informed management decisions and being properly used may save a fortune to project owners. -Vladimir Liberzon, Spider Project ... this book is very useful to practitioners seeking to expand their understanding on managing projects and project portfolios. The new concepts may help even the experienced project managers. The layout of the author's rationales in driving towards the implications contained in the chapters should also allow anyone new to project management to follow and to understand the challenges and the best practices in managing projects. -Kuo-Ting Hung, Suffolk University I found the materials to be approachable, clear and thought provoking. Mr. Devaux presents the reader with the tools to improve their project management maturity - tools essential to replacing intuition based decision making with quantifiable and justifiable analysis. -Bernard Ertl, Vice President, InterPlan Systems This book is easy to follow and clearly explains current project management methods and concepts in order to introduce the, now seemly obvious, benefits of new ones. Everything is very well presented with great examples and anecdotes used to reinforce key points. The concept of managing projects as investments should change the way people think about project management and those organizations that adopt it will gain significant advantage over their competitors. -Emily Foster, Ten Six Consulting Good , clear, concise descriptions of Steve's theory and certainly makes the case for project managers to use his methodology. It will help prevent cost and time overruns which so often occur. -Raphael M. Dua I am delighted to see an author address project management from this innovative perspective. An investment is the keystone to organizational success. If a project is viewed as such, more resources and efforts will be directed at this, thereby increasing the chances for success. Project management is an investment, not an overhead. This book brings this fact to the forefront. -Adedeji Badiru, Air Force Institute of Technology


a long awaited work by Stephen A. Devaux As a leading specialist in the project management field, Mr. Devaux has developed and demonstrated his novel methodologies using metrics such as Drag, Drag cost, DIPP and Dred. His approach may look somehow unconventional when compared to the ordinary ways relying on PMBOK Guide(r) framework. However, his view that the project is an investment endeavor has led him to deploy the new metrics and technologies described here in this new book. Tomoichi Sato, JGC Corporation/Tokyo University sets a foundation for the value of project delivery reliability and its effect on the program/portfolio business case. In a greater sense, it enlightens organizations regarding the value and importance of improving their organizational project management maturity. takes a value driven approach to organizational project management and is an enabler for Lean thinking with regards to program or portfolio management. Joseph A. Sopko, Joseph A. Sopko Consulting, LLC identifies and illuminates the secret sauce that has been at the root of many successful projects across multiple industries. [the book] can be a key competitive advantage for teams executing in the accelerating world of product development. Edward R Equi, Massachusetts Institute of Technology In his book Stephen Devaux promotes innovative approaches to project management when the project management goal is not just meeting triple constraint but maximizing project business value. He suggested new project metrics that is very useful for informed management decisions and being properly used may save a fortune to project owners. Vladimir Liberzon, Spider Project this book is very useful to practitioners seeking to expand their understanding on managing projects and project portfolios. The new concepts may help even the experienced project managers. The layout of the author s rationales in driving towards the implications containedd


Author Information

Tomasz Brozek is a technical fellow at PDF Solutions, San Jose, California, USA, where he is responsible for advanced silicon technology characterization, diagnostic methods development, and early yield ramp of integrated circuits. He holds an MS EE and a Ph.D in physics. His doctorate research at the Institute of Semiconductor Physics in Kiev, Ukraine focused on radiation effects and degradation in microelectronic MOS systems. Previously he taught and conducted research at Warsaw University of Technology, Poland and the University of California, Los Angeles, USA, and worked at Motorola R&D organizations in Texas and Arizona, USA.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

wl

Shopping Cart
Your cart is empty
Shopping cart
Mailing List