Overview
Metrology has a pivotal role to ensure the vision of fifth generation (5G) and emerging wireless technologies to be realised. It is essential to develop the underpinning metrology in response to the high demand for universal, dynamic, and data-rich wireless applications. As new technologies for 5G and beyond increasingly emerge in the arena of modern wireless devices/systems, the standards bodies, industries, and research communities are facing the challenge of diverse technological requirements, and on verifying products that meet desired performance parameters. This edited book is the first to focus on metrology for current and future wireless communication technologies. It presents a comprehensive overview of the state-of-the-art measurement capabilities, testbeds and relevant R&D activities for 5G and emerging wireless technologies at a wide range of frequencies up to THz frequency bands. Several real-world field trials and use cases are also presented. The book focuses on R&D of measurement techniques and metrology for 5G and beyond that underpin all aspects, from signals, devices, antennas, systems and propagation environments to RF exposure. The presented materials describe advances in the triad of measurement system design, measurement techniques, and underpinning metrology required to cover many wireless communications aspects. This book, Metrology for 5G and Emerging Wireless Technologies provides timely support to industry, academia, standard bodies and NMIs during the development of 5G and emerging wireless technologies and will support readers to enable further metrological R&D activities.
Full Product Details
Author: Tian Hong Loh (Principal Research Scientist, National Physical Laboratory (NPL), UK)
Publisher: Institution of Engineering and Technology
Imprint: Institution of Engineering and Technology
ISBN: 9781839532788
ISBN 10: 1839532785
Pages: 766
Publication Date: 15 February 2022
Audience:
College/higher education
,
Professional and scholarly
,
Tertiary & Higher Education
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: In Print
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Author Information
Tian Hong Loh is a principal research scientist at the National Physical Laboratory (NPL), UK. He leads work at NPL on a wide range of electromagnetic and wireless communication metrology research areas in support of the telecommunications industry. He has authored and co-authored over 160 publications and hold 6 patents. He is also a visiting professor at University of Surrey, and a visiting industrial fellow at University of Cambridge, UK. He is a UK representative of URSI Commission A (Electromagnetic Metrology), a topic editor of Electronics, an associate editor of IEEE Journal of Electromagnetics, RF and Microwaves in Medicine and Biology (J-ERM), IET Microwaves, Antennas & Propagation (MAP) Journal, IET Communications (COMMUN) Journal and International Union of Radio Science (URSI) radio science bulletin, a member of the IET and a senior member of the IEEE. He was the project coordinator of an European Association of National Metrology Institutes (EURAMET) European Metrology Programme for Innovation and Research (EMPIR) project on 'Metrology for 5G Communications', a guest editor of IET MAP special issue on 'Metrology for 5G Technologies', and was the TPC chair of the 2017 IEEE International Workshop on Electromagnetics (iWEM 2017). His research interests include metamaterials, computational electromagnetics, small antennas, smart antennas, multiple-input-multiple-output (MIMO), electromagnetic compatibility, wireless sensor networks, body-centric communication and 5G and beyond communications.
