Metrology and Physical Mechanisms in New Generation Ionic Devices
Author:   Umberto Celano
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2016
ISBN:  

9783319395302


Pages:   175
Publication Date:   24 June 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Metrology and Physical Mechanisms in New Generation Ionic Devices


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Author:   Umberto Celano
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2016
Dimensions:   Width: 15.50cm , Height: 1.30cm , Length: 23.50cm
Weight:   4.262kg
ISBN:  

9783319395302


ISBN 10:   3319395300
Pages:   175
Publication Date:   24 June 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Filamentary-Based Resistive Switching.- Nanoscaled Electrical Characterization.- Conductive Filaments: Formation, Observation and Manipulation.- Three-Dimensional Filament Observation.- Reliability Threats in CBRAM.- Conclusions and Outlook.    

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Author Information

Umberto Celano received a M.Sc. degree in Nanoelectronics from the University of Rome ``Sapienza'', Italy and a Ph.D. degree in Physics from the KU Leuven, Belgium in 2011 and 2015 respectively. Currently, he is a researcher in the material and component analysis group of imec in Belgium. Umberto's research interests include nanometer scale issues in materials, emerging nanoelectronics and physical characterization. His goal is to explore methods and novel metrology techniques that enable the understanding of the physics in nanomaterials and nanoelectronics devices.

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