Metric In Measure Spaces
Author:   James J Yeh (Univ Of California, Irvine, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789813200401


Pages:   308
Publication Date:   17 January 2020
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Metric In Measure Spaces


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Overview

Measure and metric are two fundamental concepts in measuring the size of a mathematical object. Yet there has been no systematic investigation of this relation. The book closes this gap.

Full Product Details

Author:   James J Yeh (Univ Of California, Irvine, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789813200401


ISBN 10:   9813200405
Pages:   308
Publication Date:   17 January 2020
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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