Memory Tecnology, Design, and Testing; Proceedings: International Workshop on Memory Techology, Design and Testing (2009: Hsinchu, Taiwan)
Author:   IEEE Computer Society
Publisher:   IEEE Computer Society Press
ISBN:  

9780769537979


Pages:   95
Publication Date:   01 January 2009
Format:   Paperback
Availability:   Available To Order   Availability explained
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Memory Tecnology, Design, and Testing; Proceedings: International Workshop on Memory Techology, Design and Testing (2009: Hsinchu, Taiwan)


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Author:   IEEE Computer Society
Publisher:   IEEE Computer Society Press
Imprint:   IEEE Computer Society Press
ISBN:  

9780769537979


ISBN 10:   0769537979
Pages:   95
Publication Date:   01 January 2009
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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