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OverviewFull Product DetailsAuthor: Peter Grun , Nikil D. Dutt , Alexandru NicolauPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 2003 Dimensions: Width: 15.50cm , Height: 0.80cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781441953292ISBN 10: 1441953299 Pages: 128 Publication Date: 07 December 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsRelated Work.- Early Memory Size Estimation.- Early Memory and Connectivity Architecture Exploration.- Memory-Aware Compilation.- Experiments.- Conclusions.ReviewsFrom the reviews: ""This book considers the opportunities and discusses the challenges in designing embedded memory system … . The book is well organized, up-to-date and easy to follow for self-study. … In general the book has high educational value. … The book is really interesting both for specialists in the topic, and graduate students … . The reviewer rates this book highly and recommends it to graduate students, researchers and practicing engineers in embedded systems design. Overall, the authors have done a commendable job … ."" (Mile Stojcev, Microelectronics Reliability, Vol. 47, 2004) From the reviews: This book considers the opportunities and discusses the challenges in designing embedded memory system ! . The book is well organized, up-to-date and easy to follow for self-study. ! In general the book has high educational value. ! The book is really interesting both for specialists in the topic, and graduate students ! . The reviewer rates this book highly and recommends it to graduate students, researchers and practicing engineers in embedded systems design. Overall, the authors have done a commendable job ! . (Mile Stojcev, Microelectronics Reliability, Vol. 47, 2004) Author InformationTab Content 6Author Website:Countries AvailableAll regions |