Measurement and Modeling of Silicon Heterostructure Devices
Author:   John D. Cressler (Georgia Institute of Technology, Atlanta, USA)
Publisher:   Taylor & Francis Inc
ISBN:  

9781420066920


Pages:   198
Publication Date:   13 December 2007
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Measurement and Modeling of Silicon Heterostructure Devices


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Author:   John D. Cressler (Georgia Institute of Technology, Atlanta, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 17.80cm , Height: 1.40cm , Length: 25.40cm
Weight:   0.530kg
ISBN:  

9781420066920


ISBN 10:   1420066927
Pages:   198
Publication Date:   13 December 2007
Audience:   Professional and scholarly ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Georgia Institute of Technology, Atlanta, USA

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