Mathematical Models for Systems Reliability
Author:   Benjamin Epstein ,  Ishay Weissman
Publisher:   Taylor & Francis Ltd
ISBN:  

9781420080827


Pages:   268
Publication Date:   09 May 2008
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Mathematical Models for Systems Reliability


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Full Product Details

Author:   Benjamin Epstein ,  Ishay Weissman
Publisher:   Taylor & Francis Ltd
Imprint:   Chapman & Hall/CRC
Dimensions:   Width: 15.60cm , Height: 1.90cm , Length: 23.40cm
Weight:   0.521kg
ISBN:  

9781420080827


ISBN 10:   1420080822
Pages:   268
Publication Date:   09 May 2008
Audience:   College/higher education ,  Tertiary & Higher Education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Preliminaries. Statistical Life Length Distributions. Reliability of Various Arrangements of Units. Reliability of a One-Unit Repairable System. Reliability of a Two-Unit Repairable System. Continuous-Time Markov Chains. First Passage Time for Systems Reliability. Embedded Markov Chains and Systems Reliability. Integral Equations in Reliability Theory. References. Index.

Reviews

! The material presented in the book is classic material, but is also timeless because the basic theory, probability and statistical rigor and applications to system reliability are still relevant today and important for any student or practitioner of reliability theory. ! This book has a very good set of problems, exercises and comments on how to solve these problems for every chapter. These problems are excellent if one wants to use this book as a textbook. ! The rigor and mathematical development in the book is excellent. This book is also a good reference book in the field of reliability theory for researchers ! . --Journal of Quality Technology, Vol. 41, No. 2, April 2009


... The material presented in the book is classic material, but is also timeless because the basic theory, probability and statistical rigor and applications to system reliability are still relevant today and important for any student or practitioner of reliability theory. ... This book has a very good set of problems, exercises and comments on how to solve these problems for every chapter. These problems are excellent if one wants to use this book as a textbook. ... The rigor and mathematical development in the book is excellent. This book is also a good reference book in the field of reliability theory for researchers ... . -Journal of Quality Technology, Vol. 41, No. 2, April 2009


Author Information

Epstein, Benjamin; Weissman, Ishay

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