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OverviewEvolved from the lectures of a recognized pioneer in developing the theory of reliability, Mathematical Models for Systems Reliability provides a rigorous treatment of the required probability background for understanding reliability theory. This classroom-tested text begins by discussing the Poisson process and its associated probability laws. It then uses a number of stochastic models to provide a framework for life length distributions and presents formal rules for computing the reliability of nonrepairable systems that possess commonly occurring structures. The next two chapters explore the stochastic behavior over time of one- and two-unit repairable systems. After covering general continuous-time Markov chains, pure birth and death processes, and transitions and rates diagrams, the authors consider first passage-time problems in the context of systems reliability. The final chapters show how certain techniques can be applied to a variety of reliability problems. Illustrating the models and methods with a host of examples, this book offers a sound introduction to mathematical probabilistic models and lucidly explores how they are used in systems reliability problems. Full Product DetailsAuthor: Benjamin Epstein , Ishay WeissmanPublisher: Taylor & Francis Ltd Imprint: Chapman & Hall/CRC Weight: 0.453kg ISBN: 9780367387327ISBN 10: 0367387328 Pages: 272 Publication Date: 05 September 2019 Audience: College/higher education , Tertiary & Higher Education Format: Paperback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationEpstein, Benjamin; Weissman, Ishay Tab Content 6Author Website:Countries AvailableAll regions |