Machine Learning for Hackers

Author:   Drew Conway ,  John Myles White
Publisher:   O'Reilly Media
ISBN:  

9781449303716


Pages:   300
Publication Date:   20 March 2012
Format:   Paperback
Availability:   In Print   Availability explained
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Machine Learning for Hackers


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Overview

Now that storage and collection technologies are cheaper and more precise, methods for extracting relevant information from large datasets is within the reach any experienced programmer willing to crunch data. With this book, you'll learn machine learning and statistics tools in a practical fashion, using black-box solutions and case studies instead of a traditional math-heavy presentation. By exploring each problem in this book in depth - including both viable and hopeless approaches - you'll learn to recognize when your situation closely matches traditional problems. Then you'll discover how to apply classical statistics tools to your problem. Machine Learning for Hackers is ideal for programmers from private, public, and academic sectors.

Full Product Details

Author:   Drew Conway ,  John Myles White
Publisher:   O'Reilly Media
Imprint:   O'Reilly Media
Dimensions:   Width: 17.80cm , Height: 1.90cm , Length: 23.30cm
Weight:   0.517kg
ISBN:  

9781449303716


ISBN 10:   1449303714
Pages:   300
Publication Date:   20 March 2012
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Drew Conway is a PhD candidate in Politics at NYU. He studies international relations, conflict, and terrorism using the tools of mathematics, statistics, and computer science in an attempt to gain a deeper understanding of these phenomena. His academic curiosity is informed by his years as an analyst in the U.S. intelligence and defense communities. John Myles White is a PhD candidate in Psychology at Princeton. He studies pattern recognition, decision-making, and economic behavior using behavioral methods and fMRI. He is particularly interested in anomalies of value assessment.

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