Low-Frequency Noise in Advanced Mos Devices

Author:   Martin Von Haartman
Publisher:   Springer
ISBN:  

9781281102751


Pages:   216
Publication Date:   01 January 2007
Format:   Undefined
Availability:   Available To Order   Availability explained
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Low-Frequency Noise in Advanced Mos Devices


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Overview

Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

Full Product Details

Author:   Martin Von Haartman
Publisher:   Springer
Imprint:   Springer
ISBN:  

9781281102751


ISBN 10:   128110275
Pages:   216
Publication Date:   01 January 2007
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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