Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Author:   Sascha Sadewasser ,  Thilo Glatzel
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2012
Volume:   48
ISBN:  

9783642225659


Pages:   334
Publication Date:   22 October 2011
Format:   Hardback
Availability:   Awaiting stock   Availability explained
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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces


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Overview

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Full Product Details

Author:   Sascha Sadewasser ,  Thilo Glatzel
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2012
Volume:   48
Dimensions:   Width: 15.50cm , Height: 2.50cm , Length: 23.50cm
Weight:   0.688kg
ISBN:  

9783642225659


ISBN 10:   3642225659
Pages:   334
Publication Date:   22 October 2011
Audience:   Children/juvenile ,  Children / Juvenile
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

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