Full Product Details
Author: Marta Bagatin (University of Padova, Italy) ,
Simone Gerardin (University of Padova, Italy)
Publisher: Taylor & Francis Inc
Imprint: CRC Press Inc
Volume: 50
Dimensions:
Width: 15.60cm
, Height: 2.80cm
, Length: 23.40cm
Weight: 0.725kg
ISBN: 9781498722605
ISBN 10: 1498722601
Pages: 394
Publication Date: 03 November 2015
Audience:
College/higher education
,
Professional and scholarly
,
Tertiary & Higher Education
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: In Print
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Reviews
... timely and useful. The organization of this book is excellent, covering the most popular works in the field of radiation effects. The authors for these topics are famous, qualified, and professional at the relative field. All of them have devoted many years on their specific topics. -Lili Ding, Northwest Institute of Nuclear Technology, Xi'an, China
.. . timely and useful. The organization of this book is excellent, covering the most popular works in the field of radiation effects. The authors for these topics are famous, qualified, and professional at the relative field. All of them have devoted many years on their specific topics. Lili Ding, Northwest Institute of Nuclear Technology, Xi an, China
Author Information
Marta Bagatin received her Laurea degree (cum laude) in electronic engineering and her Ph.D in information science and technology, both from the University of Padova, Italy. She is currently a postdoctoral researcher in the Department of Information Engineering at the University of Padova. Her research concerns radiation and reliability effects on electronic devices, especially on nonvolatile semiconductor memories. Marta has authored/coauthored two book chapters and more than 90 journal and conference publications. She regularly serves on committees for events such as the Nuclear and Space Radiation Effects Conference and Radiation Effects on Components and Systems, and as a journal reviewer. Simone Gerardin received his Laurea degree (cum laude) in electronics engineering and his Ph.D in electronics and telecommunications engineering, both from the University of Padova, Italy—where he is currently an assistant professor. His research concerns soft and hard errors induced by ionizing radiation in advanced CMOS technologies, and their interplay with device aging and ESD. Simone has authored/coauthored more than 150 journal papers and conference presentations, three book chapters, and three radiation effects conference tutorials. He is an associate editor for IEEE Transactions on Nuclear Science, a reviewer for several scientific journals, and a Radiation Effects Steering Group member-at-large.
