Investigations on rf breakdown phenomenon in high gradient accelerating structures
Author:   Jiahang Shao
Publisher:   Springer Verlag, Singapore
Edition:   Softcover reprint of the original 1st ed. 2018
ISBN:  

9789811356834


Pages:   131
Publication Date:   23 December 2018
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Investigations on rf breakdown phenomenon in high gradient accelerating structures


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Author:   Jiahang Shao
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   Softcover reprint of the original 1st ed. 2018
Weight:   0.454kg
ISBN:  

9789811356834


ISBN 10:   9811356831
Pages:   131
Publication Date:   23 December 2018
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Experimental research of laser triggered rf breakdown.- Experimental research of pin cathode.- In-situ high resolution  field emission imaging.- Summary and Fulture study.- Appendix A: The calculation of the electric field on the pin cathode surface Resume and publications.

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Author Information

Jiahang Shao received his Bachelor’s degree in Engineering from the Department of Electronic Engineering at Tsinghua University, China in 2011. He obtained his Ph.D. in Engineering from the Department of Engineering Physics at the same university in July 2016, where his major research project in Prof. Huaibi Chen’s group was the experimental study of rf breakdown and field emission in high gradient accelerating structures. Currently, he is a postdoctoral appointee working with Prof. Wei Gai at Argonne National Laboratory, USA, continuing his study on field emission and conducting research on wakefield generation by intense electron beam.

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