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OverviewFull Product DetailsAuthor: Alan M. PolanskyPublisher: Taylor & Francis Ltd Imprint: Chapman & Hall/CRC Weight: 0.453kg ISBN: 9780367383138ISBN 10: 0367383136 Pages: 646 Publication Date: 23 October 2019 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsThis book is clearly aimed at the student learning the material. The prose is clear and graphs are used well to illustrate concepts. Students will really like the large number of worked concrete examples. ? Each chapter has exercises and R projects that would be very helpful to solidify the understanding of the material in the chapter. These and the worked examples would make this an excellent choice for the student attempting to learn the material through self-study ? ?MAA Reviews, June 2011 This book is clearly aimed at the student learning the material. The prose is clear and graphs are used well to illustrate concepts. Students will really like the large number of worked concrete examples. ? Each chapter has exercises and R projects that would be very helpful to solidify the understanding of the material in the chapter. These and the worked examples would make this an excellent choice for the student attempting to learn the material through self-study ? ?MAA Reviews, June 2011 Author InformationAlan M. Polansky is an associate professor in the Division of Statistics at Northern Illinois University. Dr. Polansky is the author of Observed Confidence Levels: Theory and Application (CRC Press, October 2007). His research interests encompass nonparametric statistics and industrial applications of statistics. Tab Content 6Author Website:Countries AvailableAll regions |