Introduction to Statistical Limit Theory

Author:   Alan M. Polansky
Publisher:   Taylor & Francis Ltd
ISBN:  

9780367383138


Pages:   646
Publication Date:   23 October 2019
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Introduction to Statistical Limit Theory


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Author:   Alan M. Polansky
Publisher:   Taylor & Francis Ltd
Imprint:   Chapman & Hall/CRC
Weight:   0.453kg
ISBN:  

9780367383138


ISBN 10:   0367383136
Pages:   646
Publication Date:   23 October 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Reviews

This book is clearly aimed at the student learning the material. The prose is clear and graphs are used well to illustrate concepts. Students will really like the large number of worked concrete examples. ? Each chapter has exercises and R projects that would be very helpful to solidify the understanding of the material in the chapter. These and the worked examples would make this an excellent choice for the student attempting to learn the material through self-study ? ?MAA Reviews, June 2011


This book is clearly aimed at the student learning the material. The prose is clear and graphs are used well to illustrate concepts. Students will really like the large number of worked concrete examples. ? Each chapter has exercises and R projects that would be very helpful to solidify the understanding of the material in the chapter. These and the worked examples would make this an excellent choice for the student attempting to learn the material through self-study ? ?MAA Reviews, June 2011


Author Information

Alan M. Polansky is an associate professor in the Division of Statistics at Northern Illinois University. Dr. Polansky is the author of Observed Confidence Levels: Theory and Application (CRC Press, October 2007). His research interests encompass nonparametric statistics and industrial applications of statistics.

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