Overview
The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field.The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advances in this direction are presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.
Full Product Details
Author: C. Julian Chen (Department of Applied Physics and Applied Mathematics, Columbia University, New York)
Publisher: Oxford University Press
Imprint: Oxford University Press
Edition: 2nd Revised edition
Volume: 64
Dimensions:
Width: 15.80cm
, Height: 2.60cm
, Length: 23.00cm
Weight: 0.714kg
ISBN: 9780198754756
ISBN 10: 0198754752
Pages: 488
Publication Date: 17 December 2015
Audience:
College/higher education
,
Undergraduate
,
Postgraduate, Research & Scholarly
Format: Paperback
Publisher's Status: Active
Availability: To order
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.
Reviews
[A]n excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference work for those more advanced in the field. ... For everyone working in this field, the book by C. Julian Chen remains an indispensable basis, as well as an essential prerequisite for understanding the more specialized books and reviews on scanning probe microscopy. J. A. A. W. Elemans, Journal of Applied Crystrallography
[A]n excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference work for those more advanced in the field. ... For everyone working in this field, the book by C. Julian Chen remains an indispensable basis, as well as an essential prerequisite for understanding the more specialized books and reviews on scanning probe microscopy. * J. A. A. W. Elemans, Journal of Applied Crystrallography *
'An excellent book which will benefit students and scientists alike.' Tien T. Tsong, Pennsylvania State University, USA 'A remarkable achievement, a beautiful piece of work.' Andrew Briggs, University of Oxford, UK 'Provides a good introduction to the field for newcomers, and also contains valuable material and hints for experts.' Heinrich Rohrer, IBM 'The great value of the Chen book is that it attempts pedagogical soundness, and so is useful for teaching.' John Spence, Arizona State University, USA
Author Information
C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.
