Introduction to Quantum Metrology: The Revised SI System and Quantum Standards

Author:   Waldemar Nawrocki
Publisher:   Springer Nature Switzerland AG
Edition:   2nd ed. 2019
ISBN:  

9783030196769


Pages:   326
Publication Date:   14 June 2019
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Introduction to Quantum Metrology: The Revised SI System and Quantum Standards


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Overview

This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications.  In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.

Full Product Details

Author:   Waldemar Nawrocki
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   2nd ed. 2019
Weight:   0.676kg
ISBN:  

9783030196769


ISBN 10:   3030196763
Pages:   326
Publication Date:   14 June 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.
Language:   English

Table of Contents

Preface.- Theoretical Background of Quantum Metrology.- Measurements, Standards and Systems of Units.- The Revised SI System of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect and the Resistance Standard.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling.- Atomic Clocks and Time Scales.- Standards and Measurements of Length.- Satellite Navigation Systems.- Scanning Probe Microscopes.- New Standards of Mass.

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Author Information

Waldemar Nawrocki is a professor of electronics at Poznan University of Technology, Poland, where he earned a Ph.D. in technical sciences in 1981. Dr.  Nawrocki also holds a D.Sc. in physics from Jena University, Germany (since 1990). His research fields are: Quantum Metrology, Measurement System, Nanoelectronics and  Cryoelectronics. W. Nawrocki has published 15 books. From 2006 to 2016 he has organized and chaired five international conferences on quantum metrology in Poznan.

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