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Full Product Details

Author:   Mark Burns ,  Gordon W. Roberts
Publisher:   Oxford University Press Inc
Imprint:   Oxford University Press Inc
Dimensions:   Width: 19.00cm , Height: 3.90cm , Length: 23.40cm
Weight:   1.398kg
ISBN:  

9780195140163

ISBN 10:   0195140168
Pages:   704
Publication Date:   14 December 2000
Audience:   College/higher education ,  Tertiary & Higher Education
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Out of stock  

Table of Contents

CHAPTER 1: OVERVIEW OF MIXED-SIGNAL TESTING; 1.1 Mixed-Signal Ciruits; 1.2 Why Test Mixed-Signal Devices; 1.3 Post-Silicon Production Flow; 1.4 Test and Diagnostic Equipment; 1.5 New Product Development; 1.6 Mixed-Signal Testing Challenges; CHAPTER 2: THE TEST SPECIFICATION PROCESS; 2.1 Device Data Sheets; 2.2 Generating the Test Plan; 2.3 Components of a Test Program; 2.4 Summary; CHAPTER 3: DC AND PARAMETRIC MEASUREMENTS; 3.1 Continuity; 3.2 Leakage Currents; 3.3 Power Supply Currents; 3.4 DC References and Regulators; 3.5 Impedance Measurements; 3.6 DC Offset Measurements; 3.7 DC Gain Measurements; 3.8 DC Power Supply Rejection Ratio; 3.9 DC Common Mode Rejection Ratio; 3.10 Comparator DC Tests; 3.11 Voltage Search Techniques; 3.12 DC Tests for Digital Circuits; 3.13 Summary; CHAPTER 4: MEASUREMENT ACCURACY; 4.1 Terminology; 4.2 Calibrations and Checkers; 4.3 Dealing with Measurement Error; 4.4 Basic Data Analysis; 4.5 Summary; CHAPTER 5: TESTER HARDWARE; 5.1 Mixed-Signal Tester Overview; 5.2 DC Resources; 5.3 Digital Subsystem; 5.4 AC Source and Measurement; 5.5 Time Measurement System; 5.6 Computing Hardware; 5.7 Summary; CHAPTER 6: SAMPLING THEORY; 6.1 Analog Measurements Using DSP; 6.2 Sampling and Reconstruction; 6.3 Repetitive Sample Sets; 6.4 Synchronization of Sampling Systems; 6.5 Summary; CHAPTER 7: DSP-BASED TESTING; 7.1 Advantages of DSP-Based Testing; 7.2 Digital Signal Processing; 7.3 Discrete-Time Transforms; 7.4 The Inverse FFT; 7.5 Summary; CHAPTER 8: ANALOG CHANNEL TESTING; 8.1 Overview; 8.2 Gain and Level Tests; 8.3 Phase Tests; 8.4 Distortion Tests; 8.5 Signal Rejection Tests; 8.6 Noise Tests; 8.7 Simulation of Analog Channel Tests; 8.8 Summary; CHAPTER 9: SAMPLED CHANNEL TESTING; 9.1 Overview; 9.2 Sampling Considerations; 9.3 Encoding and Decoding; 9.4 Sampled Channel Tests; 9.5 Summary; CHAPTER 10: FOCUSED CALIBRATIONS; 10.1 Overview; 10.2 DC Calibrations; 10.3 AC Amplitude Calibrations; 10.4 Other AC Calibrations; 10.5 Error Cancellation Techniques; 10.6 Summary; CHAPTER 11: DAC TESTING; 11.1 Basics of Converter Testing; 11.2 Basic DC Tests; 11.3 Transfer Curve Tests; 11.4 Dynamic DAC Tests; 11.5 DAC Architectures; 11.6 Summary; CHAPTER 12: ADC TESTING; 12.1 ADC Testing Versus DAC Testing; 12.2 ADC Code Edge Measurements; 12.3 DC Tests and Transfer Curve Tests; 12.4 Dynamic ADC Tests; 12.5 ADC Architectures; 12.6 Tests for Common ADC Applications; 12.7 Summary; CHAPTER 13: DIB DESIGN; 13.1 DIB Basics; 13.2 Printed Circuit Boards (PCBS); 13.3 DIB Traces, Shields, and Guards; 13.4 Transmission Lines; 13.5 Grounding and Power Distribution; 13.6 DIB Components; 13.7 Common DIB Circuits; 13.8 Common DIB Mistakes; 13.9 Summary; CHAPTER 14: DESIGN FOR TEST (DFT); 14.1 Overview; 14.2 Advantages of DfT; 14.3 Digital Scan; 14.4 Digital BIST; 14.5 Digital DfT for Mixed-Signal Circuits; 14.6 Mixed-Signal Boundary Scan and BIST; 14.7 Ad Hoc Mixed-Signal DfT; 14.8 Subtle Forms of Analog DFT; 14.9 IDDQ; 14.10 Summary; CHAPTER 15: DATA ANALYSIS; 15.1 Introduction to Data Analysis; 15.2 Data Visualization Tools; 15.3 Statistical Analysis; 15.4 Statistical Process Control (SPC); 15.5 Summary; CHAPTER 16: TEST ECONOMICS; 16.1 Profitability Factors; 16.2 Direct Testing Costs; 16.3 Debugging Skills; 16.4 Emerging Trends; 16.5 Summary

Reviews

Burns and Roberts have written an excellent book fulfilling the need for a good textbook on the subject of mixed-signal test measurement. Engineering Science & Education, 2002

""Burns and Roberts have written an excellent book fulfilling the need for a good textbook on the subject of mixed-signal test measurement."" Engineering Science & Education, 2002

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