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OverviewFull Product DetailsAuthor: John D. Enderle , David C. Farden , Daniel J. KrausePublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Weight: 0.236kg ISBN: 9783031004865ISBN 10: 3031004868 Pages: 106 Publication Date: 31 December 2007 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Language: English Table of ContentsExpectation.- Bivariate Random Variables.ReviewsAuthor InformationJohn D. Enderle, Biomedical Engineering Program Director and Professor of Electrical & Computer Engineering at the University of Connecticut, received the B.S., M.E., and Ph.D. degrees in biomedical engineering, and M.E. degree in electrical engineering from Rensselaer Polytechnic Institute, Troy, New York, in 1975, 1977, 1980, and 1978, respectively. Dr. Enderle is a Fellow of the IEEE, the past Editor-in-Chief of the EMB Magazine (2002- 2008), the 2004 EMBS Service Award Recipient, Past-President of the IEEE-EMBS, and EMBS Conference Chair for the 22nd Annual International Conference of the IEEE EMBS and World Congress on Medical Physics and Biomedical Engineering in 2000. He is also a Fellow of the American Institute for Medical and Biological Engineering (AIMBE), Fellow of the American Society for Engineering Education and a Fellow of the Biomedical Engineering Society. Enderle is a former member of the ABET Engineering Accreditation Commission (2004-2009). In 2007, Enderle received the ASEE National Fred Merryfield Design Award. He is also a Teaching Fellow at the University of Connecticut since 1998. Tab Content 6Author Website:Countries AvailableAll regions |