Information Theory in Computer Vision and Pattern Recognition

Author:   Francisco Escolano Ruiz ,  Alan L. Yuille ,  Pablo Suau Pérez ,  Boyán Ivanov Bonev
Publisher:   Springer London Ltd
Edition:   2009 ed.
ISBN:  

9781848822962


Pages:   364
Publication Date:   31 July 2009
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Information Theory in Computer Vision and Pattern Recognition


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Overview

Information theory has proved to be effective for solving many computer vision and pattern recognition (CVPR) problems (such as image matching, clustering and segmentation, saliency detection, feature selection, optimal classifier design and many others). Nowadays, researchers are widely bringing information theory elements to the CVPR arena. Among these elements there are measures (entropy, mutual information…), principles (maximum entropy, minimax entropy…) and theories (rate distortion theory, method of types…). This book explores and introduces the latter elements through an incremental complexity approach at the same time where CVPR problems are formulated and the most representative algorithms are presented. Interesting connections between information theory principles when applied to different problems are highlighted, seeking a comprehensive research roadmap. The result is a novel tool both for CVPR and machine learning researchers, and contributes to across-fertilization of both areas.

Full Product Details

Author:   Francisco Escolano Ruiz ,  Alan L. Yuille ,  Pablo Suau Pérez ,  Boyán Ivanov Bonev
Publisher:   Springer London Ltd
Imprint:   Springer London Ltd
Edition:   2009 ed.
Dimensions:   Width: 15.50cm , Height: 2.20cm , Length: 23.50cm
Weight:   0.811kg
ISBN:  

9781848822962


ISBN 10:   1848822960
Pages:   364
Publication Date:   31 July 2009
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Interest Points, Edges, and Contour Grouping.- Contour and Region-Based Image Segmentation.- Registration, Matching, and Recognition.- Image and Pattern Clustering.- Feature Selection and Transformation.- Classifier Design.

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