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OverviewInformation theory has proved to be effective for solving many computer vision and pattern recognition (CVPR) problems (such as image matching, clustering and segmentation, saliency detection, feature selection, optimal classifier design and many others). Nowadays, researchers are widely bringing information theory elements to the CVPR arena. Among these elements there are measures (entropy, mutual information…), principles (maximum entropy, minimax entropy…) and theories (rate distortion theory, method of types…). This book explores and introduces the latter elements through an incremental complexity approach at the same time where CVPR problems are formulated and the most representative algorithms are presented. Interesting connections between information theory principles when applied to different problems are highlighted, seeking a comprehensive research roadmap. The result is a novel tool both for CVPR and machine learning researchers, and contributes to across-fertilization of both areas. Full Product DetailsAuthor: Francisco Escolano Ruiz , Alan L. Yuille , Pablo Suau Pérez , Boyán Ivanov BonevPublisher: Springer London Ltd Imprint: Springer London Ltd Edition: 2009 ed. Dimensions: Width: 15.50cm , Height: 2.20cm , Length: 23.50cm Weight: 0.811kg ISBN: 9781848822962ISBN 10: 1848822960 Pages: 364 Publication Date: 31 July 2009 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsInterest Points, Edges, and Contour Grouping.- Contour and Region-Based Image Segmentation.- Registration, Matching, and Recognition.- Image and Pattern Clustering.- Feature Selection and Transformation.- Classifier Design.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |