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OverviewFull Product DetailsAuthor: Francisco Escolano Ruiz , Alan L. Yuille , Pablo Suau Pérez , Boyán Ivanov BonevPublisher: Springer London Ltd Imprint: Springer London Ltd Edition: 2009 ed. Dimensions: Width: 15.50cm , Height: 2.00cm , Length: 23.50cm Weight: 0.587kg ISBN: 9781447156932ISBN 10: 1447156935 Pages: 364 Publication Date: 02 November 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsInterest Points, Edges, and Contour Grouping.- Contour and Region-Based Image Segmentation.- Registration, Matching, and Recognition.- Image and Pattern Clustering.- Feature Selection and Transformation.- Classifier Design.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |