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This text details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass and pulp and paper industries. It discusses safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation and analysis.

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Zhigang R. Li is Senior Research Physicist, Du Pont Central Research and Development, Wilmington, Delaware. The author or coauthor of more than 70 professional publications and book chapters in the microstructural studies of magnetic, electronic, catalyst, pharamceutical, semiconducting, optical and superconducting materials, he is a member of the Microscopy Society of America. The recipient of the Sin-France Abroad Study Award (1982-1986) and the Kazato Research Foundation of Japan Award (1986), he received the B.S. degree (1982) in optics from the Beijing Institute of Technology, China, and the Ph.D. degree (1987) in physics from the Laboratoire d'Optique Electronique du C.N.R.S., Toulouse, France.

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