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Author:   Reuben Rudman
Publisher:   Springer
Imprint:   Kluwer Academic Publishers
Edition:   Softcover reprint of the original 1st ed. 1972
Dimensions:   Width: 15.20cm , Height: 0.60cm , Length: 22.90cm
Weight:   0.200kg
ISBN:  

9789027790354

ISBN 10:   9027790353
Pages:   64
Publication Date:   July 1972
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Apparatus List.- I. Safety.- A. Warning Device.- B. Shielding.- C. Monitoring Device and Services.- II. X-ray Generators.- III. X-ray Sources and Monochromatization of Beam.- A. Isotopic Source.- B. X-ray Tube, Sealed.- C. X-ray Tube, Microfocus.- D. X-ray Tube, Rotating Anode.- E. Beta-Filter.- F. Crystal Monochromator.- IV. Detectors and Accessories.- A. Fluorescent Screen.- B. Image Intensifier.- C. Film.- D. Film Illuminator and Measuring Device.- E. Microdensitometer.- F. Quantum Counter.- G. Solid-State (Non-Dispersive).- H. Electronic Circuit for Radiation Detector.- V. Powder Techniques.- A. Sample Preparation.- B. Debye-Scherrer Technique.- C. Parafocusing (Back-Reflection) Camera.- D. Focusing Monochromatizing (Guinier-Type) Camera.- E. Flat Cassette Technique.- F. Microcamera.- G. Powder Diffractometer.- H. Giessen and Gordon Technique (Solid-State Detector X-ray Energy Analysis System).- J. Aids for Sample Identification.- VI. Single Crystal Techniques - Preliminary Studies and Crystal Mounting.- A. Study of Properties by other than X-ray Diffraction.- B. Handling and Mounting of Small Crystals.- VII. Single Crystal Techniques - Film Detectors.- A. Laue Flat Cassette Technique.- B. Oscillation-Rotation Camera.- C. Weissenberg Camera.- D. Precession Camera.- E. Combination Weissenberg - Precession Camera.- F. Retigraph Camera.- G. Reciprocal Lattice Explorer.- VIII. Single Crystal Diffractometers.- A. Equi-inclination Geometry Diffractometer.- B. Eulerian Geometry Diffractometer.- C. Kappa Axis Diffractometer.- D. Linear Diffractometer.- E. Diffractometer Accessories.- F. Modification of Other Equipment for Single-Crystal Diffractometry.- IX. Automation, Interfacing and Control of Existing Equipment.- X. Environmental Control.- A. Low-Temperature Studies.- B. High-Temperature Studies.- C. High-Pressure Studies.- XI. Other Techniques.- A. Low-Angle Scattering.- B. Topography.- C. High-Resolution Single-Crystal Camera.- XII. Miscellany.- A. Bibliographies of Crystal-Structure Analyses.- B. Computer Programs.- C. Structure Factor and Fourier Series Calculations.- D. Crystal-Structure Models.- E. Crystallographic Literature.- List of Manufacturers and Suppliers.- A. Main Listing.- B. Supplement.- Advertisements.

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