In-situ Materials Characterization: Across Spatial and Temporal Scales

Author:   Alexander Ziegler ,  Heinz Graafsma ,  Xiao Feng Zhang ,  Joost W.M. Frenken
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2014 ed.
Volume:   193
ISBN:  

9783642451515


Pages:   256
Publication Date:   10 April 2014
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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In-situ Materials Characterization: Across Spatial and Temporal Scales


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Overview

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Full Product Details

Author:   Alexander Ziegler ,  Heinz Graafsma ,  Xiao Feng Zhang ,  Joost W.M. Frenken
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2014 ed.
Volume:   193
Dimensions:   Width: 15.50cm , Height: 2.00cm , Length: 23.50cm
Weight:   5.266kg
ISBN:  

9783642451515


ISBN 10:   3642451519
Pages:   256
Publication Date:   10 April 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.

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