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OverviewFull Product DetailsAuthor: Alexander Ziegler , Heinz Graafsma , Xiao Feng Zhang , Joost W.M. FrenkenPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: Softcover reprint of the original 1st ed. 2014 Volume: 193 Dimensions: Width: 15.50cm , Height: 1.40cm , Length: 23.50cm Weight: 4.102kg ISBN: 9783662519769ISBN 10: 3662519763 Pages: 256 Publication Date: 23 August 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsScanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |