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OverviewIn-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated. Full Product DetailsAuthor: Florian Banhart (Univ De Strasbourg, France)Publisher: World Scientific Publishing Co Pte Ltd Imprint: World Scientific Publishing Co Pte Ltd Dimensions: Width: 15.70cm , Height: 2.00cm , Length: 22.90cm Weight: 0.590kg ISBN: 9789812797339ISBN 10: 9812797335 Pages: 318 Publication Date: 31 July 2008 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsEnvironmental Transmission and Scanning Transmission Electron Microscopy (R Sharma); In-Situ High-Resolution Observation of Solid-Solid, Solid-Liquid and Solid-Gas Reactions (H Saka); Atomic-Scale, In-Situ Studies of Solid-State Reactions (J L Hutchison); Functionality and Dynamical Properties of Metal Nanoclusters (J T M De Hosson & G Palasantzas); In-Situ HRTEM Studies of Interface Dynamics in Solid-Solid Phase Transformations in Metal Alloys (J M Howe); In-Situ TEM Analysis, Electrical Probing and Manipulation of Inorganic Nanotubes (D Golberg); In-Situ Ion and Electron Beam Effects on the Fabrication and Analysis of Materials (K Furuya); High-Voltage, Atomic-Resolution, In-Situ Electron Microscopy (F Phillipp); In-Situ TEM Observations of the Formation of Atomic Defects in Carbon Nanostructures (K Suenaga); Electron Irradiation of Nanomaterials (F Banhart).ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |