Impact of Electron and Scanning Probe Microscopy on Materials Research
Author:   David G. Rickerby ,  Giovanni Valdrè ,  Ugo Valdrè
Publisher:   Kluwer Academic Publishers
Edition:   Softcover reprint of the original 1st ed. 1999
Volume:   364
ISBN:  

9780792359401


Pages:   489
Publication Date:   30 September 1999
Format:   Paperback
Availability:   In Print   Availability explained
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Impact of Electron and Scanning Probe Microscopy on Materials Research


Overview

This volume presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on o(pZ) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Developments in SPM are also described.

Full Product Details

Author:   David G. Rickerby ,  Giovanni Valdrè ,  Ugo Valdrè
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   Softcover reprint of the original 1st ed. 1999
Volume:   364
Dimensions:   Width: 16.00cm , Height: 2.60cm , Length: 24.00cm
Weight:   1.580kg
ISBN:  

9780792359401


ISBN 10:   0792359402
Pages:   489
Publication Date:   30 September 1999
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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