Immittance Spectroscopy: Applications to Material Systems

Author:   Mohammad A. Alim
Publisher:   John Wiley & Sons Inc
ISBN:  

9781119184850


Pages:   426
Publication Date:   05 April 2019
Format:   Hardback
Availability:   Out of stock   Availability explained
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Immittance Spectroscopy: Applications to Material Systems


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Author:   Mohammad A. Alim
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Scrivener
Dimensions:   Width: 17.80cm , Height: 2.40cm , Length: 25.40cm
Weight:   0.950kg
ISBN:  

9781119184850


ISBN 10:   1119184851
Pages:   426
Publication Date:   05 April 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Mohammad A. Alim is a Professor in the Department of Electrical Engineering & Computer Science at Alabama A & M University (AAMU) where he joined as one of the founding faculty members in August 1998. He earned MS in Physics and PhD in Electrical Engineering & Computer Science from Marquette University in 1980 and 1986, respectively. Dr. Alim is a single-handed pioneering developer of the concurrent multiple complex plane analysis of the measured ac small-signal electrical data. His approach demonstrated lumped-parameter/complex-plane-analysis employing complex nonlinear least squares (CNLS) fitting using Levenberg-Marquardt algorithm. The achievement of the frequency-independent dielectric behavior for the polycrystalline varistors was a milestone. This outstanding work has been highly cited for a variety of complicated material systems. Thus, the immittance (impedance or admittance) spectroscopy turned to a powerful non-destructive tool in delineating underlying operative competing phenomena in a variety of material systems and devices. Most recently Dr. Alim had been instrumental in developing collaboratively MATLAB based CNLS curve fitting. His long time exposure in experiments with the state-of-the-art instruments and knowledge in supervision and maintenance is the asset for the semiconductor measurements and reverse engineering curricula. He possesses 100+ publications comprising of co-edited books, book chapters, NASA Technical Memorandum, peer reviewed journal papers, U.S. patents, and conference proceedings/abstracts, etc. beside international seminars.

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