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OverviewFull Product DetailsAuthor: Si-Wei Chen (National University of Defense Technology, China)Publisher: Taylor & Francis Ltd Imprint: CRC Press ISBN: 9781032609591ISBN 10: 1032609591 Pages: 260 Publication Date: 21 May 2026 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Paperback Publisher's Status: Forthcoming Availability: Not yet available This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release. Table of Contents1. Introduction. 2. Polarimetric Rotation Domain Interpretation Theory. 3. Polarimetric Rotation Domain Roll-Invariant Features. 4. Polarimetric Rotation Domain Land Cover Classification. 5. Polarimetric Rotation Domain Target Detection. 6. Polarimetric Rotation Domain Structure Recognition. 7. Polarimetric Rotation Domain Urban Damage Mapping.ReviewsAuthor InformationSi-Wei Chen earned a PhD (Hons.) in environmental studies at Tohoku University, Sendai, Japan, in 2012. He is a Professor at the National University of Defense Technology. He has published more than 130 journal and conference articles and coauthored three monographs and holds 28 patents. His research interests include radar polarimetry, polarimetric radar imaging, environmental study, and machine learning. Dr. Chen was a recipient of the Excellent Young Scholar from the National Natural Science Foundation of China, a recipient of the IEEE Geoscience and Remote Sensing Society (GRSS) Early Career Award, the Natural Science Foundation of Hunan Province for Distinguished Young Scholars, the Young Talent of Hunan Province, China. He won the First Prize of Invention and Innovation Award from China Association of Inventions in 2023, the Second Prize of the National Teaching Achievement Award in 2023, the Second Prize of the National Award for Progress in Science and Technology in 2021, and the First Prize of the Natural Science Award from Hunan Province of China in 2018. He is an Associate Editor of the IEEE Geoscience and Remote Sensing Letters and an Editorial Board Member of the Journal of Remote Sensing, Journal of Electronics and Information Technology, Journal of Radars, Journal of Signal Processing, and Journal of National University of Defense Technology. Tab Content 6Author Website:Countries AvailableAll regions |
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