Hot-Carrier-Induced Instabilities in N-Mosfet's with Thermally Nitrided Oxide as Gate Dielectric
Author:   馬志堅 ,  Zhi-Jian Ma
Publisher:   Open Dissertation Press
ISBN:  

9781374755444


Publication Date:   27 January 2017
Format:   Hardback
Availability:   Temporarily unavailable   Availability explained
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Hot-Carrier-Induced Instabilities in N-Mosfet's with Thermally Nitrided Oxide as Gate Dielectric


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Author:   馬志堅 ,  Zhi-Jian Ma
Publisher:   Open Dissertation Press
Imprint:   Open Dissertation Press
Dimensions:   Width: 21.60cm , Height: 1.10cm , Length: 27.90cm
Weight:   0.712kg
ISBN:  

9781374755444


ISBN 10:   1374755443
Publication Date:   27 January 2017
Audience:   General/trade ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   Temporarily unavailable   Availability explained
The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you.

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