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OverviewFull Product DetailsAuthor: Patrick H. Garrett (University of Cincinnati, Ohio, USA)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 15.60cm , Height: 1.90cm , Length: 23.40cm Weight: 0.950kg ISBN: 9780849337765ISBN 10: 0849337763 Pages: 240 Publication Date: 26 May 2005 Audience: Professional and scholarly , Professional and scholarly , Professional & Vocational , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsThermal, Mechanical, Quantum, and Analytical Sensors. Instrumentation Amplifiers and Parameter Errors. Instrumentation Filters with Nominal Error. Signal Acquisition, Conditioning, and Processing. Data Conversion Devices and Errors. Sampled Data and Recovery with Intersample Error. Advanced Instrumentation Systems and Error Analysis. Automation Systems Concurrent Engineering. Molecular Beam Epitaxy Semiconductor Processing. Aerospace Composites Rule-Based Manufacturing. Fuzzy Logic Laser Deposition Superconductor Production. Neural Network Directed Steel Annealing. X-Ray Controlled Vapor Infiltration Ceramic Densification.ReviewsAuthor InformationPatrick H. Garrett Tab Content 6Author Website:Countries AvailableAll regions |