High Performance CMOS Range Imaging: Device Technology and Systems Considerations
Author:   Andreas Süss (IMEC, Leuven, Belgium)
Publisher:   Taylor & Francis Ltd
ISBN:  

9781138029125


Pages:   262
Publication Date:   24 March 2016
Format:   Hardback
Availability:   In Print   Availability explained
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High Performance CMOS Range Imaging: Device Technology and Systems Considerations


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Author:   Andreas Süss (IMEC, Leuven, Belgium)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.612kg
ISBN:  

9781138029125


ISBN 10:   1138029122
Pages:   262
Publication Date:   24 March 2016
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1 Introduction 2 State of the art range imaging 3 Temporal noise 4 Noise performance of devices available in the 0.35μm CMOS process 5 Noise in active pixel sensors 6 On the design of PM-ToF range imagers 7 Conclusions Appendix A Derivation of the autocorrelation formula of shot noise Appendix B Measurement setups B.1 Noise measurement setup B.2 Setup to measure according to the emulated TOF principle Appendix C Photon transfer method Nomenclature Abbreviations Bibliography Index

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Author Information

Andreas Süss received his BSc from the University of Applied Sciences Düsseldorf in 2008 and a PhD degree from the University of Duisburg-Essen in 2014. From 2007 until 2014 he was affiliated to the Fraunhofer Institute IMS where he was working mainly on high-speed, low-noise imagers for e.g. ToF applications. From 2014 until 2015 he had a scholarship from the KU Leuven and worked as a postdoctoral researcher on global shutter imaging at the MICAS department in collaboration with IMEC, Leuven. As of 2015 he is hired as an R&D engineer in the IMEC imaging division, where he is currently responsible for the pixel development for global shutter and high-speed applications. His research interests include modeling, temporal noise, optimization, compressed sensing and depth imaging.

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