High Numerical Aperture EUV Lithography

Author:   XI Shan
Publisher:   Independently Published
ISBN:  

9798306519869


Pages:   308
Publication Date:   10 January 2025
Format:   Paperback
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $369.57 Quantity:  
Add to Cart

Share |

High Numerical Aperture EUV Lithography


Overview

As the semiconductor industry relentlessly pursues the limits of miniaturization, High Numerical Aperture (High-NA) Extreme Ultraviolet (EUV) Lithography emerges as the pivotal technology enabling feature sizes below 3nm. This comprehensive textbook serves as an indispensable resource for professionals and researchers aiming to master the complexities of High-NA EUV lithography. Unlock the Future of Nanolithography with This Definitive Guide Deep Dive into Optical Principles: Explore how numerical aperture influences resolution and depth of focus. Understand the physics of imaging at high NA and the challenges of achieving it in reflective optical systems. Advanced Optics Design & Manufacturing: Gain insights into designing projection optics for high-NA systems, including mirror surface optimization, multilayer coatings, and aberration control crucial for maintaining imaging fidelity. Cutting-Edge Resist Materials: Discover novel resist chemistries tailored for sub-3nm patterning. Examine the trade-offs between sensitivity, resolution, and line edge roughness (LER), and learn about innovative materials like metal-oxide and molecular resists. Simulation & Modeling Techniques: Delve into advanced simulation tools essential for predicting process outcomes. From aerial image simulation to full-chip modeling, equip yourself with the methodologies that guide design-for-manufacturing practices. Integration into Manufacturing Processes: Understand how High-NA EUV lithography fits into existing semiconductor fabrication workflows. Learn about process adjustments, compatibility with other patterning techniques, and strategies for throughput optimization. Overcoming Technical Challenges: Address critical issues such as overlay accuracy, thermal management, contamination control, and stochastic effects. Explore solutions for pellicle integration, mask defectivity, and process stability. Who Will Benefit from This Textbook? Semiconductor process engineers and lithographers seeking to implement High-NA EUV technology. Optical engineers focused on the design and optimization of high-precision projection optics. Materials scientists developing next-generation photoresists and photomask materials. Researchers and academics studying advanced nanofabrication and patterning techniques. Equip yourself with the knowledge and tools to navigate the next era of semiconductor fabrication. With detailed explanations, practical examples, and insights into the latest research and development, this textbook is your gateway to mastering High-NA EUV lithography.

Full Product Details

Author:   XI Shan
Publisher:   Independently Published
Imprint:   Independently Published
Dimensions:   Width: 15.20cm , Height: 1.70cm , Length: 22.90cm
Weight:   0.413kg
ISBN:  

9798306519869


Pages:   308
Publication Date:   10 January 2025
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

NOV RG 20252

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List