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OverviewHigh-Frequency Characterization of Electronic Packaging will be of interest to researchers and designers of high-frequency electronic packaging. Understanding high-frequency behavior of packaging is of growing importance due to higher clock-speeds in computers and higher data transmission rates in broadband telecommunication systems. Basic knowledge of the high-frequency behavior of packaging and interconnects is, therefore, indispensable for the design of future telecommunication and computer systems. Full Product DetailsAuthor: Luc MartensPublisher: Springer Imprint: Springer Edition: 1998 ed. Volume: 1 Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 0.940kg ISBN: 9780792383079ISBN 10: 0792383079 Pages: 158 Publication Date: 31 October 1998 Audience: College/higher education , Professional and scholarly , General/trade , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1: Electronic Packaging and High Frequencies.- 1.1 Packaging and high-frequency effects.- 1.2 Overview of the book chapters.- References.- 2: Electrical Description of Electronic Packaging.- 2.1 Introduction.- 2.2 Circuit descriptions.- 2.3 Qualitative characteristics.- 2.4 Conclusions.- References.- 3: High-Frequency Measurement Techniques.- 3.1 Introduction.- 3.2 Frequency-domain instruments.- 3.3 Time-domain network analyzer.- 3.4 Comparison of frequency- and time-domain network analyzers.- 3.5 Error correction.- 3.6 Conclusion.- References Appendix 3.A: Spatial resolution of the TDR/T-technique.- 4: High-Frequency Measurement Techniques for Electronic Packaging.- 4.1 Introduction.- 4.2 General test fixtures.- 4.3 Dedicated test fixtures with coaxial-planar transitions.- 4.4 On-board probing.- 4.5 Comparison of the coaxial-planar and coplanar probe transitions.- 4.6 De-embedding.- 4.7 Measuring 2N-port structures with two-port instruments.- 4.8 Conclusion.- References.- 5: Measurement-Based Modeling Algorithms.- 5.1 Introduction.- 5.2 One-port components.- 5.3 Transmission lines.- 5.4 General interconnections and packaging.- 5.5 Conclusions.- References.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |