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OverviewFull Product DetailsAuthor: Rene Van Grieken (University of Antwerp, Antwerp, Belgium) , A. Markowicz , Rene E. van GriekenPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Edition: 2nd edition Volume: v. 29 Dimensions: Width: 21.00cm , Height: 4.90cm , Length: 28.00cm Weight: 1.814kg ISBN: 9780824706005ISBN 10: 0824706005 Pages: 1004 Publication Date: 27 November 2001 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsX-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.Reviews""Industry accolades for the previous edition. . . . . .should be available to all workers in x-ray analysis, and they should do more than just scan the various chapters, but read them in detail....anyone who does that will learn something, regardless of how long they have been working in the field."" ---X-Ray Spectrometry Industry accolades for the previous edition. . . . . .should be available to all workers in x-ray analysis, and they should do more than just scan the various chapters, but read them in detail....anyone who does that will learn something, regardless of how long they have been working in the field. ---X-Ray Spectrometry Author InformationRene van GriekenAndrzej Markowicz Tab Content 6Author Website:Countries AvailableAll regions |