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OverviewThis book compiles various research papers written by experts and scientists. It is a comprehensive summary of the various features of Transmission Electron Microscopy (TEM), from fundamental mechanisms and diagnosis to the recent developments in this area. This book discusses electron microscopy, new techniques for projection of images, experimental techniques for the study of nanomaterials, among others. The book also elucidates theoretical and practical aspects of modern microscopy techniques and the usage of TEM in material characterization. It will be beneficial for students, scientists, engineers and researchers working in this field. Full Product DetailsAuthor: Lisa PagePublisher: NY Research Press Imprint: NY Research Press Dimensions: Width: 15.20cm , Height: 2.20cm , Length: 22.90cm Weight: 0.694kg ISBN: 9781632382832ISBN 10: 1632382830 Pages: 396 Publication Date: 10 March 2015 Audience: General/trade , General Format: Hardback Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |