Overview

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Full Product Details

Author:   Toru Yoshizawa (Non-Profit Organization 3D Associates, Yokohama, Japan)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Weight:   1.429kg
ISBN:  

9780849337604

ISBN 10:   0849337607
Pages:   744
Publication Date:   01 February 2009
Audience:   Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Replaced By:   9781466573598
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Out of stock  

Table of Contents

Fundamentals of Optical Elements and Devices Light Sources Natalia Dushkina Lenses, Prisms, and Mirrors Peter R. Hall Optoelectronic Sensors Motohiro Suyama Optical Devices and Optomechanical Elements Akihiko Chaki and Kenji Magara Fundamentals of Principles and Techniques for Metrology Propagation of Light Natalia Dushkina Interferometry David A. Page Holography Giancarlo Pedrini Speckle Methods and Applications Nandigana Krishna Mohan Moire Metrology Lianhua Jin Optical Heterodyne Measurement Method Masao Hirano Diffraction Toru Yoshizawa Light Scattering Lev T. Perelman Polarization Michael Shribak Near-Field Optics Wenhao Huang, Xi Li, and Guoyong Zhang Length and Size René Schödel Practical Applications Displacement Akiko Hirai, Mariko Kajima, and Souichi Telada Straightness and Alignment Ruedi Thalmann Flatness Toshiyuki Takatsuji and Youichi Bitou Surface Profi lometry Toru Yoshizawa and Toshitaka Wakayama Three-Dimensional Shape Measurement Frank Chen, Gordon M. Brown, and Mumin Song Fringe Analysis Jun-ichi Kato Photogrammetry Nobuo Kochi Optical Methods in Solid Mechanics Anand Asundi Optical Methods in Flow Measurement Sang Joon Lee Polarimetry Baoliang Wang Birefringence Measurement Yukitoshi Otani Ellipsometry Hiroyuki Fujiwara Optical Thin Film and Coatings Cheng-Chung Lee and Shigetaro Ogura Film Surface and Thickness Profi lometry Katsuichi Kitagawa On-Machine Measurements Takashi Nomura and Kazuhide Kamiya

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Author Information

Mitutoyo Corporation, Kanagawa, Japan

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