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OverviewFull Product DetailsAuthor: Kevin HardingPublisher: Taylor & Francis Ltd Imprint: CRC Press Weight: 0.975kg ISBN: 9780367576516ISBN 10: 0367576511 Pages: 506 Publication Date: 30 June 2020 Audience: College/higher education , General/trade , Tertiary & Higher Education , General Format: Paperback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsOptical Metrology: Introduction. Optical Metrology of Larger Objects. Optical Metrology of Medium-Size Objects. Optical Micro-Metrology of Small Objects. Advanced Optical Micro-Metrology Methods. Index.ReviewsThis handbook is an impressive collection of methods to make very precise measurements of location, length and surface quality. -Albert C. Claus, Optics & Photonics News, 2014 Author InformationKevin Harding is a principal scientist at GE Research in Niskayuna, New York, where he leads work in optical metrology at the R&D center and provides guidance to a wide range of optical technology projects. Internationally recognized for his work in 3D measurement technology, he has received numerous honors, including the Automated Imaging Association Leadership Award and the SME Eli Whitney Productivity Award. A SPIE fellow, Harding has published over 120 technical papers, taught more than 60 short courses and tutorials, contributed sections to six books, and received over 55 patents. Tab Content 6Author Website:Countries AvailableAll regions |
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