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OverviewContains an invaluable collection of research grade XPS spectra, including comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. * Presents XPS spectra from pure polymers and X-ray induced damage studies of polymers * Vertical and horizontal differential charging effects have been eliminated by using the flood-gun-mesh-screen system * All spectra were obtained under everyday conditions, allowing users to compare directly with in-house spectra * Self-consistent methodology that maximises reliablility and minimizes errors * Overlays of high resolution spectra before and after long-term exposure to monochromatic X-rays * Valence band spectra of pure polymers which serve as material fingerprints Full Product DetailsAuthor: B. Vincent Crist (XPS International, Ames, Iowa, USA)Publisher: John Wiley & Sons Inc Imprint: John Wiley & Sons Inc Edition: 2nd annotated edition Dimensions: Width: 19.20cm , Height: 3.40cm , Length: 26.60cm Weight: 1.077kg ISBN: 9780471492672ISBN 10: 0471492671 Pages: 454 Publication Date: 31 August 2000 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationB. Vincent Crist XPS International, Ames, Iowa Tab Content 6Author Website:Countries AvailableAll regions |