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Author:   David Shaw ,  Benjamin Liu
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
ISBN:  

9781402050480

ISBN 10:   1402050488
Pages:   2400
Publication Date:   01 January 2008
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Stock Indefinitely
Availability:   Out of stock  

Table of Contents

Part A. Fundamental Principles and Experimental Techniques 1. Formation of Particles, 2. Atmospheric Particles, 3. Characterization of Particles, 4. Aerosol Mechanics and Heat/Mass Transfer, 5. Hydrodynamics of Particles in Liquid and Electrolytic solutions, 6. Properties of micron-sized Aerosol Particles, 7. Properties of nanoparticles, 8.Properties of Nanocarbon particles, 9. Applications of Particle Technologies Part B. Particle Measurement Techniques 1.Basic Particle Behavior and Sampling, 2. Measurement of Mass Concentration, 3. Size-resolved Measurements, 4. Measurements of Aerosol Chemical Composition Part C. Particle Control Technology 1. Filtration Theory and Practice, 2. Inertial and Gravitional Separators, 3. Electrostatic Precipitation Part D. Particle Control for Clean Room Contamination Technology 1. Description of Nanoscale IC Manufacturing Clean Room, 2. Sources of particle contamination, 3. Clean room filtering systems, 4. Instrumentation for particle measurements in clean room Part E. Atmospheric Particles and Global Thermal Balance 1. Atmospheric Particle Formation, 2. Ions/Particles/Cloud Interactions in Atmosphere,

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