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Author:   Richard A Haight (Ibm Thomas J Watson Research Center, Usa) ,  Frances M Ross (Ibm Thomas J Watson Research Center, Usa) ,  James B Hannon (Ibm Thomas J Watson Research Center, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   2
Dimensions:   Width: 16.00cm , Height: 4.30cm , Length: 23.40cm
Weight:   1.383kg
ISBN:  

9789814322805

ISBN 10:   9814322806
Pages:   680
Publication Date:   01 December 2011
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

Atom Probe Tomography; Plasmon Dynamics of Nanostructured Surfaces; Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures; Nanomembranes; Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss; Rayleigh Scattering from Carbon Nanotubes; Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces; Scanning Probe Microscopy of GaN Based Structures; Time Domain Thermoreflectance for Thermal Characterization of Nanostructures; X-Ray Studies of Nanostructures; Single Nanowire Photoelectron Spectroscopy; Ultra-High Vacuum Transmission Electron Microscopy; Synthesis and Studies of Low-Dimensional Structures; Raman Spectroscopy of Carbon Nanotubes; Scanning Electron Microscopy for Characterization of Semiconducting Nanowires; X-Ray Diffraction for Stress Determination in Nanostructures.

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