Overview

"1156F-7 Genetic algorithms mimic the natural process of evolution, helping engineers optimize their designs by using the principle of ""survival of the fittest."" VLSI is especially suited to benefit from genetic algorithms - and this comprehensive book shows you how to get the best results, fast. You'll discover how genetic algorithms work and how you can use them in a wide variety of VLSI design, layout, and test automation tasks, including: * Circuit partitioning * Macro cell routing, including Steiner problems and global routing * Standard cell and macro cell placement * Circuit segmentation, FPGA mapping and pseudo-exhaustive testing * Automatic test generation including compaction, eterministic/genetic test hybrids and integration of finite state machine sequences * Peak power estimation You'll find essential insights into problem encoding and fitness functions; coverage of advanced parallel implementations; and much more. Specific experimental results are presented for every application - as are detailed problem descriptions and easy-to-adapt examples. Genetic algorithms are already being incorporated into leading electronic design automation systems. Leverage their full power now - with Genetic Algorithms For VLSI Design, Layout, and Test Automation."

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9780130115669

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PINAKI MAZUMDER is Professor in the Department of Electrical Engineering and Computer Science at The University of Michigan, Ann Arbor. He has worked for over six years at AT&T Bell Laboratories (USA), NTT (Japan), and BEL (India). He has coauthored a book entitled Testing and Testable Design of High-Density Random-Access Memories and has published over 100 archival papers on VLSI testing, physical design automation, and high-speed circuit design. ELIZABETH M. RUDNICK is Assistant Professor at the Center for Reliable and High-Performance Computing and the Department of Electrical and Computer Engineering, University of Illinois, Urbana. She has worked at Motorola, Sunrise Test Systems, and AMD, specializing in design verification, test generation, and electronic design automation.

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